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Design, Automation and Test in Europe Conference and Exhibition (DATE'03 Designers' Forum)
SoC Design and Test Considerations
Munich, Germany
March 03-March 07
ISBN: 0-7695-1870-2
ASCII Text
x 
 
Martin Schrader, Roderick McConnell, "SoC Design and Test Considerations," Design, Automation and Test in Europe Conference and Exhibition, vol. 2, pp. 20202, Design, Automation and Test in Europe Conference and Exhibition (DATE'03 Designers' Forum), 2003.
 
 
BibTex
x
 
@article{ 10.1109/DATE.2003.10225,
author = {Martin Schrader and Roderick McConnell},
title = {SoC Design and Test Considerations},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {2},
year = {2003},
issn = {1530-1591},
pages = {20202},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2003.10225},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - SoC Design and Test Considerations
SN - 1530-1591
SP
EP
A1 - Martin Schrader,
A1 - Roderick McConnell,
PY - 2003
KW - null
VL - 2
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -
 
Martin Schrader, Infineon Technologies AG
Roderick McConnell, Infineon Technologies AG
Modern SoC Design for high-volume products requires a strong focus on Design-for-Test and Design-for-Manufacturability. We present a case study of an SoC test concept, including a description of the DfT and DfM features included in the SoC device and a brief motivation for their utility.
Citation:
Martin Schrader, Roderick McConnell, "SoC Design and Test Considerations," date, vol. 2, pp.20202, Design, Automation and Test in Europe Conference and Exhibition (DATE'03 Designers' Forum), 2003
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