A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization

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Design, Automation and Test in Europe Conference and Exhibition (DATE'03)

A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization (PDF)

Munich, Germany

March 03-March 07

ISBN: 0-7695-1870-2

	ASCII Text	x
	Vikram Iyengar, Anshuman Chandra, Sharon Schweizer, Krishnendu Chakrabarty, "A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization," Design, Automation and Test in Europe Conference and Exhibition, vol. 1, pp. 11188, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003.

	BibTex	x
	@article{ 10.1109/DATE.2003.10043, author = {Vikram Iyengar and Anshuman Chandra and Sharon Schweizer and Krishnendu Chakrabarty}, title = {A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization}, journal ={Design, Automation and Test in Europe Conference and Exhibition}, volume = {1}, year = {2003}, issn = {1530-1591}, pages = {11188}, doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2003.10043}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Design, Automation and Test in Europe Conference and Exhibition TI - A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization SN - 1530-1591 SP EP A1 - Vikram Iyengar, A1 - Anshuman Chandra, A1 - Sharon Schweizer, A1 - Krishnendu Chakrabarty, PY - 2003 KW - null VL - 1 JA - Design, Automation and Test in Europe Conference and Exhibition ER -

Vikram Iyengar, IBM Microelectronics

Anshuman Chandra, Duke University

Sharon Schweizer, Duke University

Krishnendu Chakrabarty, Duke University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DATE.2003.10043

We integrate for the first time test access mechanism (TAM) optimization and test data compression into a single test methodology. We show how an integrated test architecture based on TAMs and test data decoders can be designed. The proposed approach offers considerable savings in test data volume and testing time. Two case studies using the integrated test architecture are presented.

Citation:

Vikram Iyengar, Anshuman Chandra, Sharon Schweizer, Krishnendu Chakrabarty, "A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization," date, vol. 1, pp.11188, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003

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