Hideyuki Ichihara, Tomoo Inoue,
"Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG,"
Design, Automation and Test in Europe Conference and Exhibition, vol. 1, pp. 11180, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003.
BibTex
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@article{
10.1109/DATE.2003.10057, author = {Hideyuki Ichihara and Tomoo Inoue}, title = {Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG}, journal ={Design, Automation and Test in Europe Conference and Exhibition}, volume = {1}, year = {2003}, issn = {1530-1591}, pages = {11180}, doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2003.10057}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - Design, Automation and Test in Europe Conference and Exhibition TI - Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG SN - 1530-1591 SP EP A1 - Hideyuki Ichihara, A1 - Tomoo Inoue, PY - 2003 KW - null VL - 1 JA - Design, Automation and Test in Europe Conference and Exhibition ER -
Hideyuki Ichihara, Tomoo Inoue, "Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG," date, vol. 1, pp.11180, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003
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