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Design, Automation and Test in Europe Conference and Exhibition (DATE'03)
Munich, Germany
March 03-March 07
ISBN: 0-7695-1870-2
Jean-Pierre Talpin, Inria/Irisa
Paul Guernic, Inria/Irisa
Sandeep Kumar Shukla, Virgina Tech
Rajesh Gupta, University of California at San Diego
Frédéric Doucet, University of California at San Diego
Rising complexities and performances of integrated circuits and systems, shortening time-to-market demands for electronic equipments, growing installed bases of intellectual property, requirements for adapting existing Ips with new services, all stress high-level design as a prominent research topics and call for the development of appropriate methodological solutions. In this aim, system design based on the so-called "synchronous hypothesis" consists of abstracting the non-functional implementation details of a system away and let one benefit from a focused reasoning on the logics behind the instants at which the system functionalities should be secured. From this point of view, synchronous design models and languages provide intuitive models for integrated circuits. This affinity explains the ease of generating synchronous circuits and verify their functionalities using compilers and related tools that implement this approach. In the relational model of the Signal/Polychrony design language/plateform [3, 5] this afffinity goes beyond the domain of purely synchronous circuits to embrace the context of architectures consisting of synchronous circuits and desynchronization protocols: Gals architectures. The unique features of this model are to provide the notion of polychrony: the capability to describe multi-clocked (or partially clocked) circuits and systems; and to support formal design refinement, from the early stages of requirements specification, to the later stages of synthesis and deployment, and by using formal verification techniques.
Citation:
Jean-Pierre Talpin, Paul Guernic, Sandeep Kumar Shukla, Rajesh Gupta, Frédéric Doucet, "Polychrony for Refinement-Based Design," date, vol. 1, pp.11172, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003
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