Self-Testing Embedded Checkers for Bose-Lin, Bose,and a Class of Borden Codes

D
DATE
2003
Design, Automation and Test in Europe Conference and Exhibition (DATE'03)
Abstract - Self-Testing Embedded Checkers for Bose-Lin, Bose,and a Class of Borden Codes

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Design, Automation and Test in Europe Conference and Exhibition (DATE'03)

Self-Testing Embedded Checkers for Bose-Lin, Bose,and a Class of Borden Codes (PDF)

Munich, Germany

March 03-March 07

ISBN: 0-7695-1870-2

	ASCII Text	x
	Steffen Tarnick, "Self-Testing Embedded Checkers for Bose-Lin, Bose,and a Class of Borden Codes," Design, Automation and Test in Europe Conference and Exhibition, vol. 1, pp. 11162, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003.

	BibTex	x
	@article{ 10.1109/DATE.2003.10146, author = {Steffen Tarnick}, title = {Self-Testing Embedded Checkers for Bose-Lin, Bose,and a Class of Borden Codes}, journal ={Design, Automation and Test in Europe Conference and Exhibition}, volume = {1}, year = {2003}, issn = {1530-1591}, pages = {11162}, doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2003.10146}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Design, Automation and Test in Europe Conference and Exhibition TI - Self-Testing Embedded Checkers for Bose-Lin, Bose,and a Class of Borden Codes SN - 1530-1591 SP EP A1 - Steffen Tarnick, PY - 2003 KW - null VL - 1 JA - Design, Automation and Test in Europe Conference and Exhibition ER -

Steffen Tarnick, SATCON GmbH

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DATE.2003.10146

A new approach for designing t-UED and BUED code checker is presented. In particular we conider Borden codes for t =2^k -1, Bose and Bose-Lin codes. The design technique for all three checker types follow the same principle, which is mainly based on averaging weights and check symbol values of the code word. The checkers are very well suited for use as embedded checkers since they are self-testing with respect to single stuck-at faults under very weak assumptions. All three checker types can be tested by 2 or 3 code words.

Citation:

Steffen Tarnick, "Self-Testing Embedded Checkers for Bose-Lin, Bose,and a Class of Borden Codes," date, vol. 1, pp.11162, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003

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