Modeling Noise Transfer Characteristic of Dynamic Logic Gates

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Design, Automation and Test in Europe Conference and Exhibition (DATE'03)

Modeling Noise Transfer Characteristic of Dynamic Logic Gates (PDF)

Munich, Germany

March 03-March 07

ISBN: 0-7695-1870-2

	ASCII Text	x
	Li Ding, Pinaki Mazumder, "Modeling Noise Transfer Characteristic of Dynamic Logic Gates," Design, Automation and Test in Europe Conference and Exhibition, vol. 1, pp. 11114, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003.

	BibTex	x
	@article{ 10.1109/DATE.2003.10027, author = {Li Ding and Pinaki Mazumder}, title = {Modeling Noise Transfer Characteristic of Dynamic Logic Gates}, journal ={Design, Automation and Test in Europe Conference and Exhibition}, volume = {1}, year = {2003}, issn = {1530-1591}, pages = {11114}, doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2003.10027}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Design, Automation and Test in Europe Conference and Exhibition TI - Modeling Noise Transfer Characteristic of Dynamic Logic Gates SN - 1530-1591 SP EP A1 - Li Ding, A1 - Pinaki Mazumder, PY - 2003 KW - null VL - 1 JA - Design, Automation and Test in Europe Conference and Exhibition ER -

Li Ding, University of Michigan

Pinaki Mazumder, University of Michigan

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DATE.2003.10027

Dynamic noise analysis is recently gaining more attention as a definitive method to overcome glaring deficiencies of static noise analysis. Exact dynamic noise analysis requires modeling of both injected noise and propagated noise. In this paper, we have developed a strategy to study the noise propagation problem. An efficient analytical formula has been derived to accurately model the noise waveform transfer characteristic of dynamic CMOS logic gates. Experiments have shown that the maximum error in peak propagated noises of the proposed model is less than 10%.

Citation:

Li Ding, Pinaki Mazumder, "Modeling Noise Transfer Characteristic of Dynamic Logic Gates," date, vol. 1, pp.11114, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003

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