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Design, Automation and Test in Europe Conference and Exhibition (DATE'03)
Munich, Germany
March 03-March 07
ISBN: 0-7695-1870-2
ASCII Text
x 
 
Alicia Manthe, Zhao Li, C.-J.Richard Shi, Kartikeya Mayaram, "Symbolic Analysis of Nonlinear Analog Circuits," Design, Automation and Test in Europe Conference and Exhibition, vol. 1, pp. 11108, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003.
 
 
BibTex
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@article{ 10.1109/DATE.2003.10061,
author = {Alicia Manthe and Zhao Li and C.-J.Richard Shi and Kartikeya Mayaram},
title = {Symbolic Analysis of Nonlinear Analog Circuits},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {1},
year = {2003},
issn = {1530-1591},
pages = {11108},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2003.10061},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - Symbolic Analysis of Nonlinear Analog Circuits
SN - 1530-1591
SP
EP
A1 - Alicia Manthe,
A1 - Zhao Li,
A1 - C.-J.Richard Shi,
A1 - Kartikeya Mayaram,
PY - 2003
KW - null
VL - 1
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -
 
Alicia Manthe, University of Washington
Zhao Li, University of Washington
C.-J.Richard Shi, University of Washington
Kartikeya Mayaram, Oregon State University
A new method is presented to model symbolically strongly nonlinear circuits, characterized by Piece-Wise Linear (PWL) functions. The method follows the idea of Bokhoven and Leenaerts, and formulates the problem as a linear complementarity problem (LCP). A new graph representation, called complementarity decision diagram, is introduced to represent the explicit LCP solutions. Orders of magnitude improvements in computational efficiency and memory usage have been obtained.
Citation:
Alicia Manthe, Zhao Li, C.-J.Richard Shi, Kartikeya Mayaram, "Symbolic Analysis of Nonlinear Analog Circuits," date, vol. 1, pp.11108, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003
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