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Design, Automation and Test in Europe Conference and Exhibition (DATE'03)
Munich, Germany
March 03-March 07
ISBN: 0-7695-1870-2
ASCII Text
x 
 
Abhijit K. Deb, Johnny Öberg, Axel Jantsch, "Simulation and Analysis of Embedded DSP Systems Using MASIC Methodology," Design, Automation and Test in Europe Conference and Exhibition, vol. 1, pp. 11100, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003.
 
 
BibTex
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@article{ 10.1109/DATE.2003.10068,
author = {Abhijit K. Deb and Johnny Öberg and Axel Jantsch},
title = {Simulation and Analysis of Embedded DSP Systems Using MASIC Methodology},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {1},
year = {2003},
issn = {1530-1591},
pages = {11100},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2003.10068},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - Simulation and Analysis of Embedded DSP Systems Using MASIC Methodology
SN - 1530-1591
SP
EP
A1 - Abhijit K. Deb,
A1 - Johnny Öberg,
A1 - Axel Jantsch,
PY - 2003
KW - null
VL - 1
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -
 
Abhijit K. Deb, Royal Institute of Technology
Johnny Öberg, Royal Institute of Technology
Axel Jantsch, Royal Institute of Technology
MASIC, short for Maths to ASIC, models embedded DSP systems using grammar based technique. This paper presents a simulation and analysis technique for the MASIC model of a system. We build a Petri Net (PN) representation of the MASIC model to simulate the communication architecture. It helps to evaluate the effects of architectural decisions early in the design cycle. The correctness of the protocol description is analyzed using PN based boundedness and conservation analysis.
Citation:
Abhijit K. Deb, Johnny Öberg, Axel Jantsch, "Simulation and Analysis of Embedded DSP Systems Using MASIC Methodology," date, vol. 1, pp.11100, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003
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