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Design, Automation and Test in Europe Conference and Exhibition (DATE'03)
Platform-Based Testbench Generation
Munich, Germany
March 03-March 07
ISBN: 0-7695-1870-2
R. Henftling, Infineon Technologies AG
A. Zinn, Infineon Technologies AG
M. Bauer, Infineon Technologies AG
W. Ecker, Infineon Technologies AG
M. Zambaldi, Infineon Technologies AG
This paper presents a new technology that accelerates system verification. In a real life example, we achieved a speed-up of a factor of about 5000. The key for this speed-up is a configurable, synthesizable testbench architecture, which can be completely mapped to emulators or FPGAs. Exploiting generic controllers and re-using protocol-specific stimuli generators combined with topology and micro-program generation is responsible for almost zero overhead compared to behavioral testbenches.
Citation:
R. Henftling, A. Zinn, M. Bauer, W. Ecker, M. Zambaldi, "Platform-Based Testbench Generation," date, vol. 1, pp.11038, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003
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