loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Design, Automation and Test in Europe Conference and Exhibition (DATE'03)
Munich, Germany
March 03-March 07
ISBN: 0-7695-1870-2
Heinz-Joseph Schlebusch, Synopsys, Germany
Gary Smith, Gartner Dataquest, USA
Donatella Sciuto, Politecnico di Milano, Italy
Daniel Gajski, University of California at Irvine
Carsten Mielenz, Infineon Technologies, Germany
Christopher K. Lennard, ARM Ltd., United Kingdom
Frank Ghenassia, ST Microelectronics, France
Stuart Swan, Cadence, USA
Joachim Kunkel, Synopsys, USA

Complex systems on chip (SoCs) present challenges in the design and verification process that cannot be adequately addressed by traditional methodologies based on register transfer descriptions. Some of the aspects are efficient design exploration based on component reuse, getting closure on the architecture, as well as early development, integration and verification of embedded software. In search for responses to these challenges, Transaction level modeling (TLM) has got quite some attention in the area of SoC design. This panel attempts to do a reality Check on TLM from an engineering point of view.

Questions to discuss are: Is the Transaction Level (TL) really useful for the design and/or for the verification of SoCs? How can TL speed up the design process and lowering the risk of design failures? What are the implications on tools, languages, and Intellectual Property (IP) used in the design/verification process? The panelists will share their thoughts on transaction based design and verification, and will discuss benefits and issues based on their experiences of applying transaction level methodologies.

Citation:
Heinz-Joseph Schlebusch, Gary Smith, Donatella Sciuto, Daniel Gajski, Carsten Mielenz, Christopher K. Lennard, Frank Ghenassia, Stuart Swan, Joachim Kunkel, "Transaction Based Design: Another Buzzword or the Solution to a Design Problem?," date, vol. 1, pp.10876, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003
Usage of this product signifies your acceptance of the Terms of Use.