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Design, Automation and Test in Europe Conference and Exhibition (DATE'03)
Multi-Granularity Metrics for the Era of Strongly Personalized SOCs
Munich, Germany
March 03-March 07
ISBN: 0-7695-1870-2
ASCII Text
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Y. Le Moullec, N. Ben Amor, J-Ph. Diguet, M. Abid, J-L. Philippe, "Multi-Granularity Metrics for the Era of Strongly Personalized SOCs," Design, Automation and Test in Europe Conference and Exhibition, vol. 1, pp. 10674, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003.
 
 
BibTex
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@article{ 10.1109/DATE.2003.10096,
author = {Y. Le Moullec and N. Ben Amor and J-Ph. Diguet and M. Abid and J-L. Philippe},
title = {Multi-Granularity Metrics for the Era of Strongly Personalized SOCs},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {1},
year = {2003},
issn = {1530-1591},
pages = {10674},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2003.10096},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - Multi-Granularity Metrics for the Era of Strongly Personalized SOCs
SN - 1530-1591
SP
EP
A1 - Y. Le Moullec,
A1 - N. Ben Amor,
A1 - J-Ph. Diguet,
A1 - M. Abid,
A1 - J-L. Philippe,
PY - 2003
KW - null
VL - 1
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -
 
Y. Le Moullec, Universit? de Bretagne Sud
N. Ben Amor, Universit? de Bretagne Sud and ENIS
J-Ph. Diguet, Universit? de Bretagne Sud
M. Abid, ENIS
J-L. Philippe, Universit? de Bretagne Sud
This paper details the first step of the Design Trotter framework or design space exploration applied to dedicated SOCs. The aim of this step is to provide metrics in order to guide the designer and the synthesis tool towards an efficient application architecture matching. This work presents a computation of metrics at all levels of the application graph-based hierarchy. These metrics are computed through data and control dependency analysis. They quantify the memory, control and processing orientations as well as the average of parallelism for different granularities.
Citation:
Y. Le Moullec, N. Ben Amor, J-Ph. Diguet, M. Abid, J-L. Philippe, "Multi-Granularity Metrics for the Era of Strongly Personalized SOCs," date, vol. 1, pp.10674, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003
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