Built-In Self-Test (BIST) becomes important also for more complex structures like complete front-ends. In order to bring down the costs for the test overhead, Spectral Signature Analysis at system level seems to be a promising concept. Investigations that have been carried out are targeted on the most challenging problems: Generation of the Test Signature, Evaluation of the Signature Response, Implementation of the concept and Verification by Simulation. From investigations it can be concluded that the concept is suitable especially in the case of transceiver-type DUT.