Delay Defect Diagnosis Based Upon Statistical Timing Models

D
DATE
2003
Design, Automation and Test in Europe Conference and Exhibition (DATE'03)
Abstract - Delay Defect Diagnosis Based Upon Statistical Timing Models — The First Step

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Design, Automation and Test in Europe Conference and Exhibition (DATE'03)

Delay Defect Diagnosis Based Upon Statistical Timing Models — The First Step

Munich, Germany

March 03-March 07

ISBN: 0-7695-1870-2

	ASCII Text	x
	Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou, Magdy S. Abadir, "Delay Defect Diagnosis Based Upon Statistical Timing Models — The First Step," Design, Automation and Test in Europe Conference and Exhibition, vol. 1, pp. 10328, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003.

	BibTex	x
	@article{ 10.1109/DATE.2003.10007, author = {Angela Krstic and Li-C. Wang and Kwang-Ting Cheng and Jing-Jia Liou and Magdy S. Abadir}, title = {Delay Defect Diagnosis Based Upon Statistical Timing Models — The First Step}, journal ={Design, Automation and Test in Europe Conference and Exhibition}, volume = {1}, year = {2003}, issn = {1530-1591}, pages = {10328}, doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2003.10007}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Design, Automation and Test in Europe Conference and Exhibition TI - Delay Defect Diagnosis Based Upon Statistical Timing Models — The First Step SN - 1530-1591 SP EP A1 - Angela Krstic, A1 - Li-C. Wang, A1 - Kwang-Ting Cheng, A1 - Jing-Jia Liou, A1 - Magdy S. Abadir, PY - 2003 KW - null VL - 1 JA - Design, Automation and Test in Europe Conference and Exhibition ER -

Angela Krstic, University of California at Santa Barbara

Li-C. Wang, University of California at Santa Barbara

Kwang-Ting Cheng, University of California at Santa Barbara

Jing-Jia Liou, National Tsing-Hua University

Magdy S. Abadir, Motorola Inc.

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DATE.2003.10007

This paper defines a new diagnosis problem for diagnosing delay defects based upon statistical timing models. We illustrate the differences between the delay defect diagnosis and traditional logic defect diagnosis. We propose different diagnosis algorithms, and evaluate their performance via statistical defect injection and statistical delay fault simulation. With a statistical timing analysis framework developed in the past, we demonstrate the new concepts in delay defect diagnosis, and discuss experimental results based upon benchmark circuits.

Citation:

Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou, Magdy S. Abadir, "Delay Defect Diagnosis Based Upon Statistical Timing Models — The First Step," date, vol. 1, pp.10328, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003

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