A Technique for High Ratio LZW Compression

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	Similar Articles Articles by Michael J. Knieser Articles by Francis G. Wolff Articles by Chris A. Papachristou Articles by Daniel J. Weyer Articles by David R. McIntyre

Design, Automation and Test in Europe Conference and Exhibition (DATE'03)

Munich, Germany

March 03-March 07

ISBN: 0-7695-1870-2

	ASCII Text	x
	Michael J. Knieser, Francis G. Wolff, Chris A. Papachristou, Daniel J. Weyer, David R. McIntyre, "A Technique for High Ratio LZW Compression," Design, Automation and Test in Europe Conference and Exhibition, vol. 1, pp. 10116, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003.

	BibTex	x
	@article{ 10.1109/DATE.2003.10080, author = {Michael J. Knieser and Francis G. Wolff and Chris A. Papachristou and Daniel J. Weyer and David R. McIntyre}, title = {A Technique for High Ratio LZW Compression}, journal ={Design, Automation and Test in Europe Conference and Exhibition}, volume = {1}, year = {2003}, issn = {1530-1591}, pages = {10116}, doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2003.10080}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Design, Automation and Test in Europe Conference and Exhibition TI - A Technique for High Ratio LZW Compression SN - 1530-1591 SP EP A1 - Michael J. Knieser, A1 - Francis G. Wolff, A1 - Chris A. Papachristou, A1 - Daniel J. Weyer, A1 - David R. McIntyre, PY - 2003 KW - null VL - 1 JA - Design, Automation and Test in Europe Conference and Exhibition ER -

Michael J. Knieser, Indiana University Purdue University Indianapolis

Francis G. Wolff, Case Western Reserve University

Chris A. Papachristou, Case Western Reserve University

Daniel J. Weyer, Cisco Systems

David R. McIntyre, Cleveland State University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DATE.2003.10080

Reduction of both the test suite size and the download time of test vectors is important in today's System-On-a-Chip designs. In this paper, a method for compressing the scan test patterns using the LZW algorithm is presented. This method leverages the large number of "Don't-Cares" in test vectors in order to improve the compression ratio significantly. The hardware decompression architecture presented here uses existing on-chip embedded memories. Tests using the ISCAS89 and the ITC99 benchmarks show that this method achieves high compression ratios.

Citation:

Michael J. Knieser, Francis G. Wolff, Chris A. Papachristou, Daniel J. Weyer, David R. McIntyre, "A Technique for High Ratio LZW Compression," date, vol. 1, pp.10116, Design, Automation and Test in Europe Conference and Exhibition (DATE'03), 2003

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