Macromodeling of Digital I/O Ports for System EMC Assessment

D
DATE
2002
2002 Design, Automation and Test in Europe Conference and Exhibition (DATE'02)
Abstract - Macromodeling of Digital I/O Ports for System EMC Assessment

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2002 Design, Automation and Test in Europe Conference and Exhibition (DATE'02)

Paris, France

March 04-March 08

ISBN: 0-7695-1471-5

	ASCII Text	x
	I. Stievano, F. Canavero, I. Maio, Z. Chen, D. Becker, G. Katopis, "Macromodeling of Digital I/O Ports for System EMC Assessment," Design, Automation and Test in Europe Conference and Exhibition, pp. 1044, 2002 Design, Automation and Test in Europe Conference and Exhibition (DATE'02), 2002.

	BibTex	x
	@article{ 10.1109/DATE.2002.998429, author = {I. Stievano and F. Canavero and I. Maio and Z. Chen and D. Becker and G. Katopis}, title = {Macromodeling of Digital I/O Ports for System EMC Assessment}, journal ={Design, Automation and Test in Europe Conference and Exhibition}, volume = {0}, year = {2002}, isbn = {0-7695-1471-5}, pages = {1044}, doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2002.998429}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Design, Automation and Test in Europe Conference and Exhibition TI - Macromodeling of Digital I/O Ports for System EMC Assessment SN - 0-7695-1471-5 SP EP A1 - I. Stievano, A1 - F. Canavero, A1 - I. Maio, A1 - Z. Chen, A1 - D. Becker, A1 - G. Katopis, PY - 2002 VL - 0 JA - Design, Automation and Test in Europe Conference and Exhibition ER -

I. Stievano

F. Canavero

I. Maio

Z. Chen

D. Becker

G. Katopis

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DATE.2002.998429

This paper addresses the development of accurate and efficient behavioral models of digital integrated circuit input and output ports for EMC and signal integrity simulations. A practical modeling process is proposed and applied to some example devices. The modeling process is simple and efficient, and it yields models performing at a very high accuracy level.

Citation:

I. Stievano, F. Canavero, I. Maio, Z. Chen, D. Becker, G. Katopis, "Macromodeling of Digital I/O Ports for System EMC Assessment," date, pp.1044, 2002 Design, Automation and Test in Europe Conference and Exhibition (DATE'02), 2002

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