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2002 Design, Automation and Test in Europe Conference and Exhibition (DATE'02)
Minimal Test for Coupling Faults in Word-Oriented Memories
Paris, France
March 04-March 08
ISBN: 0-7695-1471-5
ASCII Text
x 
 
A. van de Goor, M. Abadir, A. Carlin, "Minimal Test for Coupling Faults in Word-Oriented Memories," Design, Automation and Test in Europe Conference and Exhibition, pp. 0944, 2002 Design, Automation and Test in Europe Conference and Exhibition (DATE'02), 2002.
 
 
BibTex
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@article{ 10.1109/DATE.2002.998413,
author = {A. van de Goor and M. Abadir and A. Carlin},
title = {Minimal Test for Coupling Faults in Word-Oriented Memories},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {0},
year = {2002},
isbn = {0-7695-1471-5},
pages = {0944},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2002.998413},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - Minimal Test for Coupling Faults in Word-Oriented Memories
SN - 0-7695-1471-5
SP
EP
A1 - A. van de Goor,
A1 - M. Abadir,
A1 - A. Carlin,
PY - 2002
KW - State coupling faults
KW - word-oriented memories
KW - tests
KW - data backgrounds
KW - m-out-of-n codes.
VL - 0
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -
 
Most industrial memories have an external word-width of more than one bit. However, most published memory test algorithms assume 1-bit memories; they will not detect coupling faults between the cells of a word. This paper improves upon the state of the art in testing word-oriented memories by presenting a new method for detecting state coupling faults between cells of the same word, based on the use of m-out-of-n codes. The result is a reduction in test time, which varies between 20 and 38%.
Index Terms:
State coupling faults, word-oriented memories, tests, data backgrounds, m-out-of-n codes.
Citation:
A. van de Goor, M. Abadir, A. Carlin, "Minimal Test for Coupling Faults in Word-Oriented Memories," date, pp.0944, 2002 Design, Automation and Test in Europe Conference and Exhibition (DATE'02), 2002
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