Analog Circuit Sizing Using Adaptive Worst-Case Parameter Sets

D
DATE
2002
2002 Design, Automation and Test in Europe Conference and Exhibition (DATE'02)
Abstract - Analog Circuit Sizing Using Adaptive Worst-Case Parameter Sets

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2002 Design, Automation and Test in Europe Conference and Exhibition (DATE'02)

Paris, France

March 04-March 08

ISBN: 0-7695-1471-5

	ASCII Text	x
	R. Schwencker, F. Schenkel, M. Pronath, H. Graeb, "Analog Circuit Sizing Using Adaptive Worst-Case Parameter Sets," Design, Automation and Test in Europe Conference and Exhibition, pp. 0581, 2002 Design, Automation and Test in Europe Conference and Exhibition (DATE'02), 2002.

	BibTex	x
	@article{ 10.1109/DATE.2002.998359, author = {R. Schwencker and F. Schenkel and M. Pronath and H. Graeb}, title = {Analog Circuit Sizing Using Adaptive Worst-Case Parameter Sets}, journal ={Design, Automation and Test in Europe Conference and Exhibition}, volume = {0}, year = {2002}, isbn = {0-7695-1471-5}, pages = {0581}, doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2002.998359}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Design, Automation and Test in Europe Conference and Exhibition TI - Analog Circuit Sizing Using Adaptive Worst-Case Parameter Sets SN - 0-7695-1471-5 SP EP A1 - R. Schwencker, A1 - F. Schenkel, A1 - M. Pronath, A1 - H. Graeb, PY - 2002 VL - 0 JA - Design, Automation and Test in Europe Conference and Exhibition ER -

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DATE.2002.998359

In this paper, a method for nominal design of analog integrated circuits is presented that includes process variations and operating ranges by worst-case parameter sets. These sets are calculated adaptively during the sizing process based on sensitivity analyses. The method leads to robust designs with high parametric yield, while being much more efficient than design centering methods.

Citation:

R. Schwencker, F. Schenkel, M. Pronath, H. Graeb, "Analog Circuit Sizing Using Adaptive Worst-Case Parameter Sets," date, pp.0581, 2002 Design, Automation and Test in Europe Conference and Exhibition (DATE'02), 2002

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