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2002 Design, Automation and Test in Europe Conference and Exhibition (DATE'02)
Analog IP Testing: Diagnosis and Optimization
Paris, France
March 04-March 08
ISBN: 0-7695-1471-5
ASCII Text
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C. Guardiani, P. McNamara, L. Daldoss, S. Saxena, S. Zanella, W. Xiang, S. Liu, "Analog IP Testing: Diagnosis and Optimization," Design, Automation and Test in Europe Conference and Exhibition, pp. 0192, 2002 Design, Automation and Test in Europe Conference and Exhibition (DATE'02), 2002.
 
 
BibTex
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@article{ 10.1109/DATE.2002.998269,
author = {C. Guardiani and P. McNamara and L. Daldoss and S. Saxena and S. Zanella and W. Xiang and S. Liu},
title = {Analog IP Testing: Diagnosis and Optimization},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {0},
year = {2002},
isbn = {0-7695-1471-5},
pages = {0192},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2002.998269},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - Analog IP Testing: Diagnosis and Optimization
SN - 0-7695-1471-5
SP
EP
A1 - C. Guardiani,
A1 - P. McNamara,
A1 - L. Daldoss,
A1 - S. Saxena,
A1 - S. Zanella,
A1 - W. Xiang,
A1 - S. Liu,
PY - 2002
VL - 0
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -
 
In this paper, we present an innovative methodology to estimate and improve the quality of analog and mixed-signal circuit testing. We first detect and reduce the redundancy in the electrical test measurements (e-tests), then we identify the e-test acceptability regions by considering performance specifications as well as process parameter distributions. Finally, we provide an effective metric for the accurate assessment of the parametric test coverage of embedded analog IP. Experimental results confirm the validity of the proposed methodology and its broad applicability to analog, mixed-signal and RF applications for different process technologies.
Citation:
C. Guardiani, P. McNamara, L. Daldoss, S. Saxena, S. Zanella, W. Xiang, S. Liu, "Analog IP Testing: Diagnosis and Optimization," date, pp.0192, 2002 Design, Automation and Test in Europe Conference and Exhibition (DATE'02), 2002
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