Carsten Wegener, Michael Peter Kennedy, "Incorporation of Hard-Fault-Coverage in Model-Based Testing of Mixed-Signal ICs," Design, Automation and Test in Europe Conference and Exhibition, pp. 765, Design, Automation and Test in Europe (DATE '00), 2000.

@article{ 10.1109/DATE.2000.840898,
author = {Carsten Wegener and Michael Peter Kennedy},
title = {Incorporation of Hard-Fault-Coverage in Model-Based Testing of Mixed-Signal ICs},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {0},
year = {2000},
issn = {1530-1591},
pages = {765},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2000.840898},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - Incorporation of Hard-Fault-Coverage in Model-Based Testing of Mixed-Signal ICs
SN - 1530-1591
SP
EP
A1 - Carsten Wegener,
A1 - Michael Peter Kennedy,
PY - 2000
KW - Defect and Tolerance-Oriented Test
KW - ATPG and Fault Modeling
KW - Analog and Mixed-Signal Test
VL - 0
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -