Mixed-Signal BIST Using Correlation and Reconfigurable Hardware

D
DATE
2000
Design, Automation and Test in Europe (DATE '00)
Abstract - Mixed-Signal BIST Using Correlation and Reconfigurable Hardware

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Design, Automation and Test in Europe (DATE '00)

Paris, France

March 27-March 30

ISBN: 0-7695-0537-6

	ASCII Text	x
	J. Machado da Silva, J.S. Duarte, J.S. Matos, "Mixed-Signal BIST Using Correlation and Reconfigurable Hardware," Design, Automation and Test in Europe Conference and Exhibition, pp. 744, Design, Automation and Test in Europe (DATE '00), 2000.

	BibTex	x
	@article{ 10.1109/DATE.2000.840877, author = {J. Machado da Silva and J.S. Duarte and J.S. Matos}, title = {Mixed-Signal BIST Using Correlation and Reconfigurable Hardware}, journal ={Design, Automation and Test in Europe Conference and Exhibition}, volume = {0}, year = {2000}, issn = {1530-1591}, pages = {744}, doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2000.840877}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Design, Automation and Test in Europe Conference and Exhibition TI - Mixed-Signal BIST Using Correlation and Reconfigurable Hardware SN - 1530-1591 SP EP A1 - J. Machado da Silva, A1 - J.S. Duarte, A1 - J.S. Matos, PY - 2000 VL - 0 JA - Design, Automation and Test in Europe Conference and Exhibition ER -

J. Machado da Silva, University of Porto

J.S. Duarte, University of Porto

J.S. Matos, University of Porto

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DATE.2000.840877

Reconfiguring existing hardware to perform test related control and processing functions could achieve reducing the area overhead required by BIST structures. This work shows how the resources required for these operations can be implemented in-circuit, taking advantage of programmable logic available in the system. Structural and functional tests are performed using correlation to obtain IDD and Vout cross-correlation signatures, and to measure gain, phase, and total harmonic distortion.

Citation:

J. Machado da Silva, J.S. Duarte, J.S. Matos, "Mixed-Signal BIST Using Correlation and Reconfigurable Hardware," date, pp.744, Design, Automation and Test in Europe (DATE '00), 2000

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