Design, Automation and Test in Europe (DATE '00) Reducing the Complexity of Defect Level Modeling Using the Clustering Effect Paris, France March 27-March 30 ISBN: 0-7695-0537-6
Accounting for the clustering effect is fundamental to increase the accuracy of Defect Level (DL) modeling. This result has long been known in yield modeling but, as far as known, only one DL model directly accounts for it. In this paper we improve this model, reducing its number of parameters from three to two by noticing that multiple faults caused by a single defect can also be modeled as additional clustering. Our result is supported by test data from a real production line.
Index Terms:
defect clustering, defect level, fault clustering, fault coverage, reject ratio
Citation:
José T. de Sousa, Vishwani D. Agrawal, "Reducing the Complexity of Defect Level Modeling Using the Clustering Effect," date, pp.640, Design, Automation and Test in Europe (DATE '00), 2000 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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