Static Timing Analysis Taking Crosstalk into Account

D
DATE
2000
Design, Automation and Test in Europe (DATE '00)
Abstract - Static Timing Analysis Taking Crosstalk into Account

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Design, Automation and Test in Europe (DATE '00)

Paris, France

March 27-March 30

ISBN: 0-7695-0537-6

	ASCII Text	x
	M. Ringe, T. Lindenkreuz, E. Barke, "Static Timing Analysis Taking Crosstalk into Account," Design, Automation and Test in Europe Conference and Exhibition, pp. 451, Design, Automation and Test in Europe (DATE '00), 2000.

	BibTex	x
	@article{ 10.1109/DATE.2000.840310, author = {M. Ringe and T. Lindenkreuz and E. Barke}, title = {Static Timing Analysis Taking Crosstalk into Account}, journal ={Design, Automation and Test in Europe Conference and Exhibition}, volume = {0}, year = {2000}, issn = {1530-1591}, pages = {451}, doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2000.840310}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Design, Automation and Test in Europe Conference and Exhibition TI - Static Timing Analysis Taking Crosstalk into Account SN - 1530-1591 SP EP A1 - M. Ringe, A1 - T. Lindenkreuz, A1 - E. Barke, PY - 2000 VL - 0 JA - Design, Automation and Test in Europe Conference and Exhibition ER -

M. Ringe

T. Lindenkreuz

E. Barke

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DATE.2000.840310

Capacitance coupling can have a significant impact on gate delay in today's deep submicron circuits. In this paper we present a static timing analysis tool that calculates the longest path of synchronous circuits taking the impact of crosstalk on gate delays into account. We show that passive modeling of the coupling capacitance can significantly underestimate the delay and that an assumption of permanent worst-case coupling unnecessarily overestimates it. Our method is validated by comparison to Spice simulations.

Citation:

M. Ringe, T. Lindenkreuz, E. Barke, "Static Timing Analysis Taking Crosstalk into Account," date, pp.451, Design, Automation and Test in Europe (DATE '00), 2000

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