Timothy J. Bergfeld, Dirk Niggemeyer, Elizabeth M. Rudnick, "Diagnostic Testing of Embedded Memories Using BIST," Design, Automation and Test in Europe Conference and Exhibition, pp. 305, Design, Automation and Test in Europe (DATE '00), 2000.

@article{ 10.1109/DATE.2000.840288,
author = {Timothy J. Bergfeld and Dirk Niggemeyer and Elizabeth M. Rudnick},
title = {Diagnostic Testing of Embedded Memories Using BIST},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {0},
year = {2000},
issn = {1530-1591},
pages = {305},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2000.840288},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - Diagnostic Testing of Embedded Memories Using BIST
SN - 1530-1591
SP
EP
A1 - Timothy J. Bergfeld,
A1 - Dirk Niggemeyer,
A1 - Elizabeth M. Rudnick,
PY - 2000
VL - 0
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -