Higher levels of integration, the need for test re-use, and the mixed-signal nature of today's SOC's necessitate hierarchical test generation and system level test composition to meet stringent market requirements. In this paper, a novel methodology for testing analog and digital components in a signal path is discussed. Consequent testability analysis can be utilized to reduce DFT requirements, while test translation provides highly effective low cost test. The proposed approach seamlessly propagates test information across the analog/digital divide. Experimental results substantiate the effectiveness of the proposed mixed-signal test synthesis methodology.