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Design, Automation and Test in Europe (DATE '00)
Stay Away from Minimum Design-Rule Values
Paris, France
March 27-March 30
ISBN: 0-7695-0537-6
ASCII Text
x 
 
Chris W.H. Strolenberg, "Stay Away from Minimum Design-Rule Values," Design, Automation and Test in Europe Conference and Exhibition, pp. 71, Design, Automation and Test in Europe (DATE '00), 2000.
 
 
BibTex
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@article{ 10.1109/DATE.2000.840019,
author = {Chris W.H. Strolenberg},
title = {Stay Away from Minimum Design-Rule Values},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {0},
year = {2000},
issn = {1530-1591},
pages = {71},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2000.840019},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - Stay Away from Minimum Design-Rule Values
SN - 1530-1591
SP
EP
A1 - Chris W.H. Strolenberg,
PY - 2000
VL - 0
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -
 
With the introduction of 0.18 micron CMOS process technology a new phenomenon in circuit manufacturing can be observed: design-rule values as specified in the design-rule manual are no longer "hard" numbers. Where designers and EDA tool manufacturers used to consider rule-values as strict limits when creating mask layouts, rule values have turned into gray areas around the specified rule values.
Citation:
Chris W.H. Strolenberg, "Stay Away from Minimum Design-Rule Values," date, pp.71, Design, Automation and Test in Europe (DATE '00), 2000
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