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Design, Automation and Test in Europe (DATE '00)
Tutorial Statement
Paris, France
March 27-March 30
ISBN: 0-7695-0537-6
ASCII Text
x 
 
Yervant Zorian, Michael Nicolaidis, Peter Muhmenthaler, David Lepejian, Chris Strolenberg, Kees Veelenturf, "Tutorial Statement," Design, Automation and Test in Europe Conference and Exhibition, pp. 66, Design, Automation and Test in Europe (DATE '00), 2000.
 
 
BibTex
x
 
@article{ 10.1109/DATE.2000.10000,
author = {Yervant Zorian and Michael Nicolaidis and Peter Muhmenthaler and David Lepejian and Chris Strolenberg and Kees Veelenturf},
title = {Tutorial Statement},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {0},
year = {2000},
issn = {1530-1591},
pages = {66},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2000.10000},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - Tutorial Statement
SN - 1530-1591
SP
EP
A1 - Yervant Zorian,
A1 - Michael Nicolaidis,
A1 - Peter Muhmenthaler,
A1 - David Lepejian,
A1 - Chris Strolenberg,
A1 - Kees Veelenturf,
PY - 2000
VL - 0
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -
 
Thanks to the swift advance of semiconductor technology companies continually do introduce new embedded functions in their integrated circuits. Embedded support functions, such as for Design-for-Testability, have already become traditional. Today, advanced embedded functions, beyond DFT, are being introduced into new designs to enhance the overall reliability of an IC, to contribute to the analysis of its defects, and to help optimize the yield. This embedded tutorial will discuss a variety of advanced design practices meant to improve reliability and yield.
Citation:
Yervant Zorian, Michael Nicolaidis, Peter Muhmenthaler, David Lepejian, Chris Strolenberg, Kees Veelenturf, "Tutorial Statement," date, pp.66, Design, Automation and Test in Europe (DATE '00), 2000
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