Projective Convolution: RLC Model-Order Reduction Using the Impulse Response

D
DATE
1999
Design, Automation and Test in Europe (DATE '99)
Abstract - Projective Convolution: RLC Model-Order Reduction Using the Impulse Response

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Design, Automation and Test in Europe (DATE '99)

Munich, Germany

March 09-March 12

ISBN: 0-7695-0078-1

	ASCII Text	x
	B. Sheehan, "Projective Convolution: RLC Model-Order Reduction Using the Impulse Response," Design, Automation and Test in Europe Conference and Exhibition, pp. 669, Design, Automation and Test in Europe (DATE '99), 1999.

	BibTex	x
	@article{ 10.1109/DATE.1999.761201, author = {B. Sheehan}, title = {Projective Convolution: RLC Model-Order Reduction Using the Impulse Response}, journal ={Design, Automation and Test in Europe Conference and Exhibition}, volume = {0}, year = {1999}, issn = {1530-1591}, pages = {669}, doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.1999.761201}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Design, Automation and Test in Europe Conference and Exhibition TI - Projective Convolution: RLC Model-Order Reduction Using the Impulse Response SN - 1530-1591 SP EP A1 - B. Sheehan, PY - 1999 VL - 0 JA - Design, Automation and Test in Europe Conference and Exhibition ER -

B. Sheehan

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DATE.1999.761201

Projective convolution (PC) is a provably passive and numerically well-conditioned model-order reduction technique for large RLC circuits including those with floating capacitors or inductor loops. Unlike moment-matching which operates in the frequency domain, PC is positioned squarely in the time domain: it matches the impulse response of a circuit by projecting with the Krylov space formed by solving the discretized differential equations of the circuit. PC gives excellent results for coupled lines, large RLC meshes, and clock trees.

Citation:

B. Sheehan, "Projective Convolution: RLC Model-Order Reduction Using the Impulse Response," date, pp.669, Design, Automation and Test in Europe (DATE '99), 1999

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