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Design, Automation and Test in Europe (DATE '99)
Coupled Noise Estimation for Distributed RC Interconnect Model
Munich, Germany
March 09-March 12
ISBN: 0-7695-0078-1
Janet M. Wang, University of California at Berkeley
Qingjian Yu, University of California at Berkeley
Ernest S. Kuh, University of California at Berkeley
With the increase in signal speed and the development of process technology, distributed RC line model is found to be more suitable for on-chip interconnects than lumped RC model, especially for interconnects around and below 0.25?m. In this paper, we first describe a new explicit form for crosstalk approximation for coupled RC lines. Then we introduce a novel passive model order reduction technique for distributed RC lines. These two parts serve as two steps in static noise analysis of full on-chip interconnect networks which are called pruning process and static analysis process.
Citation:
Janet M. Wang, Qingjian Yu, Ernest S. Kuh, "Coupled Noise Estimation for Distributed RC Interconnect Model," date, pp.664, Design, Automation and Test in Europe (DATE '99), 1999
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