As society has become more reliant on electronics, the need for fault tolerant ICs has increased. This has resulted in significant research into both fault tolerant controller design, and mechanisms for datapath fault tolerance insertion. By treating these two issues separately, previous work has failed to address compatibility issues, as well as efficient codesign methodologies. In this paper, we present a unified approach to detecting control and datapath faults through the datapath, along with a method for fault identification and reconfiguration. By detecting control faults in the datapath, we avoid the area and performance overhead of detecting control faults through duplication or error checking codes. The result is a complete design methodology for self recovering architectures capable of far more efficient solutions than previous approaches.