Jongchul Shin, Hyunjin Kim, Sungho Kang, "At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks," Design, Automation and Test in Europe Conference and Exhibition, pp. 473, Design, Automation and Test in Europe (DATE '99), 1999.

@article{ 10.1109/DATE.1999.761168,
author = {Jongchul Shin and Hyunjin Kim and Sungho Kang},
title = {At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {0},
year = {1999},
issn = {1530-1591},
pages = {473},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.1999.761168},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks
SN - 1530-1591
SP
EP
A1 - Jongchul Shin,
A1 - Hyunjin Kim,
A1 - Sungho Kang,
PY - 1999
VL - 0
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -