Highly Testable and Compact 1-out-of-n Code Checker with Single Output

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	Similar Articles Articles by C. Metra Articles by M. Favalli Articles by B. Riccò

Design Automation and Test in Europe (DATE '98)

Paris, France

February 23-February 26

ISBN: 0-8186-8359-7

	ASCII Text	x
	C. Metra, M. Favalli, B. Riccò, "Highly Testable and Compact 1-out-of-n Code Checker with Single Output," Design, Automation and Test in Europe Conference and Exhibition, pp. 981, Design Automation and Test in Europe (DATE '98), 1998.

	BibTex	x
	@article{ 10.1109/DATE.1998.655999, author = {C. Metra and M. Favalli and B. Riccò}, title = {Highly Testable and Compact 1-out-of-n Code Checker with Single Output}, journal ={Design, Automation and Test in Europe Conference and Exhibition}, volume = {0}, year = {1998}, isbn = {0-8186-8359-7}, pages = {981}, doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.1998.655999}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Design, Automation and Test in Europe Conference and Exhibition TI - Highly Testable and Compact 1-out-of-n Code Checker with Single Output SN - 0-8186-8359-7 SP EP A1 - C. Metra, A1 - M. Favalli, A1 - B. Riccò, PY - 1998 KW - Self-checking circuit KW - checker KW - 1-out-of-n code VL - 0 JA - Design, Automation and Test in Europe Conference and Exhibition ER -

C. Metra

M. Favalli

B. Riccò

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DATE.1998.655999

This paper presents a novel 1-out-of-n checker that, compared to the other implementations up to now presented, features the advantages of: i) satisfying the TSC or SCD property with respect to all possible internal faults representative of realistic failures; ii) presenting a single output line; iii) requiring significantly lower area overhead.

Index Terms:

Self-checking circuit, checker, 1-out-of-n code

Citation:

C. Metra, M. Favalli, B. Riccò, "Highly Testable and Compact 1-out-of-n Code Checker with Single Output," date, pp.981, Design Automation and Test in Europe (DATE '98), 1998

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