Design Automation and Test in Europe (DATE '98) IOCIMU - An Integrated Off-Chip IDDQ Measurement Unit Paris, France February 23-February 26 ISBN: 0-8186-8359-7
The implementation of an Off-Chip IDDQ monitor to support the test of complex ASICs is presented in this paper. The monitor can be incorporated into a standard automated test equipment (ATE). It is capable of driving a 2mF capacitive load and can perform measurements of the IDDQ of a device under test (DUT) in the 0-1mA range. According to measurements the monitor can operate at the test rates up to 30kHz and offers an resolution better than 0.1mA. The on-chip integrated bypass switch is capable of handling DUT transient currents up to several amps. The IOCIMU prototype was fabricated in the 2-mm Mietec BiCMOS technology and has an active chip area of 20mm2.
Citation:
M. Svajda, B. Straka, H. Manhaeve, "IOCIMU - An Integrated Off-Chip IDDQ Measurement Unit," date, pp.959, Design Automation and Test in Europe (DATE '98), 1998 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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