P. Nordholz, H. Grabinski, D. Treytnar, J. Otterstedt, D. Niggemeyer, U. Arz, T.W. Williams,
"Core Interconnect Testing Hazards,"
Design, Automation and Test in Europe Conference and Exhibition, pp. 953, Design Automation and Test in Europe (DATE '98), 1998.
BibTex
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@article{
10.1109/DATE.1998.655985, author = {P. Nordholz and H. Grabinski and D. Treytnar and J. Otterstedt and D. Niggemeyer and U. Arz and T.W. Williams}, title = {Core Interconnect Testing Hazards}, journal ={Design, Automation and Test in Europe Conference and Exhibition}, volume = {0}, year = {1998}, isbn = {0-8186-8359-7}, pages = {953}, doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.1998.655985}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - Design, Automation and Test in Europe Conference and Exhibition TI - Core Interconnect Testing Hazards SN - 0-8186-8359-7 SP EP A1 - P. Nordholz, A1 - H. Grabinski, A1 - D. Treytnar, A1 - J. Otterstedt, A1 - D. Niggemeyer, A1 - U. Arz, A1 - T.W. Williams, PY - 1998 VL - 0 JA - Design, Automation and Test in Europe Conference and Exhibition ER -
P. Nordholz, H. Grabinski, D. Treytnar, J. Otterstedt, D. Niggemeyer, U. Arz, T.W. Williams, "Core Interconnect Testing Hazards," date, pp.953, Design Automation and Test in Europe (DATE '98), 1998
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