Analog Test Design with IDD Measurements for the Detection of Parametric and Catastrophic Faults

D
DATE
1998
Design Automation and Test in Europe (DATE '98)
Abstract - Analog Test Design with IDD Measurements for the Detection of Parametric and Catastrophic Faults

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Design Automation and Test in Europe (DATE '98)

Paris, France

February 23-February 26

ISBN: 0-8186-8359-7

	ASCII Text	x
	Walter M. Lindermeir, Thomas J. Vogels, Helmut E. Graeb, "Analog Test Design with IDD Measurements for the Detection of Parametric and Catastrophic Faults," Design, Automation and Test in Europe Conference and Exhibition, pp. 822, Design Automation and Test in Europe (DATE '98), 1998.

	BibTex	x
	@article{ 10.1109/DATE.1998.655953, author = {Walter M. Lindermeir and Thomas J. Vogels and Helmut E. Graeb}, title = {Analog Test Design with IDD Measurements for the Detection of Parametric and Catastrophic Faults}, journal ={Design, Automation and Test in Europe Conference and Exhibition}, volume = {0}, year = {1998}, isbn = {0-8186-8359-7}, pages = {822}, doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.1998.655953}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Design, Automation and Test in Europe Conference and Exhibition TI - Analog Test Design with IDD Measurements for the Detection of Parametric and Catastrophic Faults SN - 0-8186-8359-7 SP EP A1 - Walter M. Lindermeir, A1 - Thomas J. Vogels, A1 - Helmut E. Graeb, PY - 1998 KW - analog and mixed-signal test design KW - IDD spectral measurements KW - measurement noise KW - fault modeling KW - test decision criteria KW - fault coverage KW - yield coverage KW - discrimination analysis VL - 0 JA - Design, Automation and Test in Europe Conference and Exhibition ER -

Walter M. Lindermeir, Technical University of Munich

Thomas J. Vogels, Technical University of Munich

Helmut E. Graeb, Technical University of Munich

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DATE.1998.655953

Earlier approaches dealt with the detection of catastrophic faults based on IDD monitoring. Consideration of the more subtle parametric faults and the ADC quantization noise, however, is essential for high-quality analog testing. The paper presents a new design method for analog test of parametric and catastrophic faults by IDD monitoring. ADC quantization noise is systematically considered throughout the method. Results prove its effectiveness.

Index Terms:

analog and mixed-signal test design, IDD spectral measurements, measurement noise, fault modeling, test decision criteria, fault coverage, yield coverage, discrimination analysis

Citation:

Walter M. Lindermeir, Thomas J. Vogels, Helmut E. Graeb, "Analog Test Design with IDD Measurements for the Detection of Parametric and Catastrophic Faults," date, pp.822, Design Automation and Test in Europe (DATE '98), 1998

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