Design Automation and Test in Europe (DATE '98) A Fully Digital Controlled Off-Chip IDDQ Measurement Unit Paris, France February 23-February 26 ISBN: 0-8186-8359-7
The paper describes a new Digital controlled Off-Chip IDDQ Measurement Unit (DOCIMU), which provides reliable precision and relatively fast measurements, even with a high capacitive load, while the Device Under Test (DUT) is unaffected. The maximal resolution is 50nA and the accurate measurement range is 1mA. Unlike other IDDQ monitors, the DOCIMU copes with external interference, as it needs no analogue pin to set the IDDQ limit and the noise at the VDD is eliminated via a special S/H feature. The DOCIMU is also a testable IDDQ monitor, which is another unique feature.
Index Terms:
IDDQ, IDDQ monitors, testability, CMOS, integrated circuits, test hardware
Citation:
B. Straka, H. Manhaeve, J. Vanneuville, M. Svajda, "A Fully Digital Controlled Off-Chip IDDQ Measurement Unit," date, pp.495, Design Automation and Test in Europe (DATE '98), 1998 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb