loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Design Automation and Test in Europe (DATE '98)
Built-In Self-Test with an Alternating Output
Paris, France
February 23-February 26
ISBN: 0-8186-8359-7
T. Bogue, University of Waterloo
M. Gössel, Universit?t Potsdam
H. Jürgensen, The University of Western Ontario
Y. Zorian, Logic Vision Inc.
A new compaction technique based on signature analysis is presented. Rather than comparing the final signature with the expected one after the test is completed, the binary output of the MISA is converted into an alternating binary signal by two simple cover circuits. An error is indicated whenever the alternation of the output signal is disturbed. This technique results in a higher fault coverage, improved fault diagnosis capability, a greater test autonomy in core-based designs, and early fault notification.
Index Terms:
Built-in self-test, circuit testing, cover circuit
Citation:
T. Bogue, M. Gössel, H. Jürgensen, Y. Zorian, "Built-In Self-Test with an Alternating Output," date, pp.180, Design Automation and Test in Europe (DATE '98), 1998
Usage of this product signifies your acceptance of the Terms of Use.