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Design Automation and Test in Europe (DATE '98)
Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs
Paris, France
February 23-February 26
ISBN: 0-8186-8359-7
V. N. Yarmolik, Belarussian State University of Informatics and Radioelectronics
S. Hellebrand, University of Stuttgart
H.-J. Wunderlich, University of Stuttgart
After write operations, BIST schemes for RAMS relying on signature analysis must compress the entire memory contents to update the reference signature. This paper introduces a new scheme for output data compression which avoids this overhead while retaining the benefits of signature analysis. The proposed technique is based on a new memory characteristic derived as the modulo-2 sum of all addresses pointing to non-zero cells. This characteristic can be adjusted concurrently with write operations by simple EXOR-operations on the initial characteristic and on the addresses affected by the change.
Citation:
V. N. Yarmolik, S. Hellebrand, H.-J. Wunderlich, "Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs," date, pp.173, Design Automation and Test in Europe (DATE '98), 1998
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