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2004 Conference on Computer Vision and Pattern Recognition Workshop (CVPRW'04) Volume 4
Combining Top-Down and Bottom-Up Segmentation
Washington, D.C., USA
June 27-July 02
ISBN: 0-7695-2158-4
Eran Borenstein, Weizmann Institute of Science, Rehovot, Israel
Eitan Sharon, Brown University, Providence, RI
Shimon Ullman, Weizmann Institute of Science, Rehovot, Israel
In this work we show how to combine bottom-up and top-down approaches into a single figure-ground segmentation process. This process provides accurate delineation of object boundaries that cannot be achieved by either the top-down or bottom-up approach alone. The top-down approach uses object representation learned from examples to detect an object in a given input image and provide an approximation to its figure-ground segmentation. The bottom-up approach uses image-based criteria to define coherent groups of pixels that are likely to belong together to either the figure or the background part. The combination provides a final segmentation that draws on the relative merits of both approaches: The result is as close as possible to the top-down approximation, but is also constrained by the bottom-up process to be consistent with significant image discontinuities. We construct a global cost function that represents these top-down and bottom-up requirements. We then show how the global minimum of this function can be efficiently found by applying the sum-product algorithm. This algorithm also provides a confidence map that can be used to identify image regions where additional top-down or bottom-up information may further improve the segmentation. Our experiments show that the results derived from the algorithm are superior to results given by a pure top-down or pure bottom-up approach. The scheme has broad applicability, enabling the combined use of a range of existing bottom-up and top-down segmentations.
Citation:
Eran Borenstein, Eitan Sharon, Shimon Ullman, "Combining Top-Down and Bottom-Up Segmentation," cvprw, vol. 4, pp.46, 2004 Conference on Computer Vision and Pattern Recognition Workshop (CVPRW'04) Volume 4, 2004
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