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27th Annual International Computer Software and Applications Conference
An Efficient Defect Estimation Method for Software Defect Curves
Dallas, Texas
November 03-November 06
ISBN: 0-7695-2020-0
Chenggang Bai, Beijing University of Aeronautics and Astronautics, China
Kai-Yuan Cai, Beijing University of Aeronautics and Astronautics, China
T.Y. Chen, University of Technology, Australia
Software defect curves describe the behavior of the estimate of the number of remaining software defects as software testing proceeds. They are of two possible patterns: single-trapezoidal-like curves or multiple-trapezoidal-like curves. In this paper we present some necessary and/or sufficient conditions for software defect curves of the Goel-Okumoto NHPP model. These conditions can be used to predict the effect of the detection and removal of a software defect on the variations of the estimates of the number of remaining defects. A field software reliability dataset is used to justify the trapezoidal shape of software defect curves and our theoretical analyses. The results presented in this paper may provide useful feedback information for assessing software testing progress and have potentials in the emerging area of software cybernetics that explores the interplay between software and control.
Citation:
Chenggang Bai, Kai-Yuan Cai, T.Y. Chen, "An Efficient Defect Estimation Method for Software Defect Curves," compsac, pp.534, 27th Annual International Computer Software and Applications Conference, 2003
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