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13th Asian Test Symposium (ATS'04)
Reduce Yield Loss in Delay Defect Detection in Slack Interval
Kenting, Taiwan
November 15-November 17
ISBN: 0-7695-2235-1
ASCII Text
x 
 
Haihua Yan, Adit D. Singh, "Reduce Yield Loss in Delay Defect Detection in Slack Interval," Asian Test Symposium, pp. 372-377, 13th Asian Test Symposium (ATS'04), 2004.
 
 
BibTex
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@article{ 10.1109/ATS.2004.74,
author = {Haihua Yan and Adit D. Singh},
title = {Reduce Yield Loss in Delay Defect Detection in Slack Interval},
journal ={Asian Test Symposium},
volume = {0},
year = {2004},
issn = {1081-7735},
pages = {372-377},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2004.74},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - Reduce Yield Loss in Delay Defect Detection in Slack Interval
SN - 1081-7735
SP372
EP377
A1 - Haihua Yan,
A1 - Adit D. Singh,
PY - 2004
KW - null
VL - 0
JA - Asian Test Symposium
ER -
 
Haihua Yan, Auburn University
Adit D. Singh, Auburn University
A new delay-testing scheme that identifies abnormal delays in the slack interval by comparing switching delays in neighboring dies on a wafer has been recently proposed and validated on experimental circuits. The simulation showed orders of magnitude delay defect detection efficiency improvement. In this paper we investigated the yield loss problem and proposed a practical production test based on delay defect detection in slack interval (DDSI).
Citation:
Haihua Yan, Adit D. Singh, "Reduce Yield Loss in Delay Defect Detection in Slack Interval," ats, pp.372-377, 13th Asian Test Symposium (ATS'04), 2004
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