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13th Asian Test Symposium (ATS'04)
Classification of Sequential Circuits Based on τk Notation
Kenting, Taiwan
November 15-November 17
ISBN: 0-7695-2235-1
ASCII Text
x 
 
Chia Yee Ooi, Hideo Fujiwara, "Classification of Sequential Circuits Based on τk Notation," Asian Test Symposium, pp. 348-353, 13th Asian Test Symposium (ATS'04), 2004.
 
 
BibTex
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@article{ 10.1109/ATS.2004.31,
author = {Chia Yee Ooi and Hideo Fujiwara},
title = {Classification of Sequential Circuits Based on τk Notation},
journal ={Asian Test Symposium},
volume = {0},
year = {2004},
issn = {1081-7735},
pages = {348-353},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2004.31},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - Classification of Sequential Circuits Based on τk Notation
SN - 1081-7735
SP348
EP353
A1 - Chia Yee Ooi,
A1 - Hideo Fujiwara,
PY - 2004
KW - null
VL - 0
JA - Asian Test Symposium
ER -
 
Chia Yee Ooi, Nara Institute of Science and Technology
Hideo Fujiwara, Nara Institute of Science and Technology
In this paper, we introduce a new test generation complexity notation called τ^k notation, which consists of τ^k-equivalent and τ^k-bounded, in order to clarify the classification of sequential circuits based on combinational test generation complexity. We reconsider the test generation complexity for the existing classes of acyclic sequential circuits. Several new classes of sequential circuits that cover some cyclic sequential circuits have been identified as being τ-equivalent and τ-bounded.
Citation:
Chia Yee Ooi, Hideo Fujiwara, "Classification of Sequential Circuits Based on τk Notation," ats, pp.348-353, 13th Asian Test Symposium (ATS'04), 2004
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