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13th Asian Test Symposium (ATS'04)
Nonlinear CA Based Scalable Design of On-Chip TPG for Multiple Cores
Kenting, Taiwan
November 15-November 17
ISBN: 0-7695-2235-1
Sukanta Das, Bengal Engineering College
Biplab K. Sikdar, Bengal Engineering College
P Pal Chaudhuri, Flat E4
This paper reports an efficient design of Test Pattern Generators (TPGs) for a chip having multiple cores. It is built around nonlinear Cellular Automata (CA) based Pseudo-Random Pattern Generator (PRPG). The modular and cascadable structure of proposed n-cell PRPG can be utilized to construct the (n = 1)-cell PRPG without sacrificing the pseudo-randomness quality. The efficiency of such a scalable PRPG structure is demonstrated in designing the on-chip TPGs for a VLSI chip implementing multiple cores.
Citation:
Sukanta Das, Biplab K. Sikdar, P Pal Chaudhuri, "Nonlinear CA Based Scalable Design of On-Chip TPG for Multiple Cores," ats, pp.331-334, 13th Asian Test Symposium (ATS'04), 2004
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