Dynamic Analog Testing via ATE Digital Test Channels

A
ATS
2004
13th Asian Test Symposium (ATS'04)
Abstract - Dynamic Analog Testing via ATE Digital Test Channels

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	Similar Articles Articles by C. C. Su Articles by C. S. Chang Articles by H. W. Huang Articles by D. S. Tu Articles by C. L. Lee Articles by Jerry C. H. Lin

13th Asian Test Symposium (ATS'04)

Kenting, Taiwan

November 15-November 17

ISBN: 0-7695-2235-1

	ASCII Text	x
	C. C. Su, C. S. Chang, H. W. Huang, D. S. Tu, C. L. Lee, Jerry C. H. Lin, "Dynamic Analog Testing via ATE Digital Test Channels," Asian Test Symposium, pp. 308-312, 13th Asian Test Symposium (ATS'04), 2004.

	BibTex	x
	@article{ 10.1109/ATS.2004.37, author = {C. C. Su and C. S. Chang and H. W. Huang and D. S. Tu and C. L. Lee and Jerry C. H. Lin}, title = {Dynamic Analog Testing via ATE Digital Test Channels}, journal ={Asian Test Symposium}, volume = {0}, year = {2004}, issn = {1081-7735}, pages = {308-312}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2004.37}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Dynamic Analog Testing via ATE Digital Test Channels SN - 1081-7735 SP308 EP312 A1 - C. C. Su, A1 - C. S. Chang, A1 - H. W. Huang, A1 - D. S. Tu, A1 - C. L. Lee, A1 - Jerry C. H. Lin, PY - 2004 KW - null VL - 0 JA - Asian Test Symposium ER -

C. C. Su, National Chiao Tung University

C. S. Chang, National Chiao Tung University

H. W. Huang, National Chiao Tung University

D. S. Tu, National Chiao Tung University

C. L. Lee, National Chiao Tung University

Jerry C. H. Lin, SynTest Technologies, Inc.

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2004.37

A dynamic analog test methodology using digital tester is proposed. A simple triangular waveform is built on the device interface board for the stimulus generation. The response waveform is quantized by the dual comparators in a digital pin electronic circuit. . Statistical analysis is conducted to enhance the quantization resolution and minimize the noise effect. The experimental results using an ATE show that the error is less than 2%. It confirms the feasibility of the proposed methodology.

Citation:

C. C. Su, C. S. Chang, H. W. Huang, D. S. Tu, C. L. Lee, Jerry C. H. Lin, "Dynamic Analog Testing via ATE Digital Test Channels," ats, pp.308-312, 13th Asian Test Symposium (ATS'04), 2004

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