A New Path Delay Test Scheme Based on Path Delay Inertia

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Chung Liang Chen Articles by Chung Len Lee Articles by Ming-Shae Wu

13th Asian Test Symposium (ATS'04)

Kenting, Taiwan

November 15-November 17

ISBN: 0-7695-2235-1

	ASCII Text	x
	Chung Liang Chen, Chung Len Lee, Ming-Shae Wu, "A New Path Delay Test Scheme Based on Path Delay Inertia," Asian Test Symposium, pp. 140-144, 13th Asian Test Symposium (ATS'04), 2004.

	BibTex	x
	@article{ 10.1109/ATS.2004.11, author = {Chung Liang Chen and Chung Len Lee and Ming-Shae Wu}, title = {A New Path Delay Test Scheme Based on Path Delay Inertia}, journal ={Asian Test Symposium}, volume = {0}, year = {2004}, issn = {1081-7735}, pages = {140-144}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2004.11}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - A New Path Delay Test Scheme Based on Path Delay Inertia SN - 1081-7735 SP140 EP144 A1 - Chung Liang Chen, A1 - Chung Len Lee, A1 - Ming-Shae Wu, PY - 2004 KW - null VL - 0 JA - Asian Test Symposium ER -

Chung Liang Chen, National Chiao Tung University

Chung Len Lee, National Chiao Tung University

Ming-Shae Wu, National Chiao Tung University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2004.11

This paper proposes a new path delay test scheme based on path delay inertia. The scheme only applies pulses of specified widths, which are proportional to path delays, to paths-under-test. It is simple, eliminating the conventional two-pattern test for delay faults. Issues, such as sensitivity of applied pulse widths w.r.t. path delay, related with the scheme were studied and an experimental chip was implemented to demonstrate the scheme.

Citation:

Chung Liang Chen, Chung Len Lee, Ming-Shae Wu, "A New Path Delay Test Scheme Based on Path Delay Inertia," ats, pp.140-144, 13th Asian Test Symposium (ATS'04), 2004

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.