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12th Asian Test Symposium (ATS'03)
Xi?an, China
November 16-November 19
ISBN: 0-7695-1951-2
ASCII Text
x 
 
He Hu, Sun Yihe, "Test-Point Selection Algorithm Using Small Signal Model for Scan-Based BIST," Asian Test Symposium, pp. 507, 12th Asian Test Symposium (ATS'03), 2003.
 
 
BibTex
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@article{ 10.1109/ATS.2003.1250877,
author = {He Hu and Sun Yihe},
title = {Test-Point Selection Algorithm Using Small Signal Model for Scan-Based BIST},
journal ={Asian Test Symposium},
volume = {0},
year = {2003},
issn = {1081-7735},
pages = {507},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2003.1250877},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - Test-Point Selection Algorithm Using Small Signal Model for Scan-Based BIST
SN - 1081-7735
SP
EP
A1 - He Hu,
A1 - Sun Yihe,
PY - 2003
KW - null
VL - 0
JA - Asian Test Symposium
ER -
 
He Hu, Tsinghua University
Sun Yihe, Tsinghua University
A test point selection algorithm TEPSAUS (TEst-Point Selection Algorithm Using Small signal model) for scan based build-in self-test (BIST) is proposed in this paper. In order to reduce the computational complexity, the algorithm uses Small Signal Model (SSM) to build recursion formulas for cost reduction functions. With the recursion functions, the cost reduction functions can be calculated efficiently.
Citation:
He Hu, Sun Yihe, "Test-Point Selection Algorithm Using Small Signal Model for Scan-Based BIST," ats, pp.507, 12th Asian Test Symposium (ATS'03), 2003
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