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12th Asian Test Symposium (ATS'03)
Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test
Xi?an, China
November 16-November 19
ISBN: 0-7695-1951-2
ASCII Text
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Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo, "Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test," Asian Test Symposium, pp. 406, 12th Asian Test Symposium (ATS'03), 2003.
 
 
BibTex
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@article{ 10.1109/ATS.2003.1250846,
author = {Hiroyuki Michinishi and Tokumi Yokohira and Takuji Okamoto and Toshifumi Kobayashi and Tsutomu Hondo},
title = {Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test},
journal ={Asian Test Symposium},
volume = {0},
year = {2003},
issn = {1081-7735},
pages = {406},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2003.1250846},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test
SN - 1081-7735
SP
EP
A1 - Hiroyuki Michinishi,
A1 - Tokumi Yokohira,
A1 - Takuji Okamoto,
A1 - Toshifumi Kobayashi,
A1 - Tsutomu Hondo,
PY - 2003
KW - null
VL - 0
JA - Asian Test Symposium
ER -
 
Hiroyuki Michinishi, Okayama University of Science
Tokumi Yokohira, Okayama University
Takuji Okamoto, Okayama University of Science
Toshifumi Kobayashi, Mitsubishi Electric Co.
Tsutomu Hondo, Sharp Takaya Electronics Industry Co.,Ltd.
We already proposed a supply current test method for detecting floating gate defects in CMOS ICs. In the method, increase of the supply current caused by defects is promoted by superposing a sinusoidal signal on the supply voltage. In this study, we propose one way to improve detectability of the method for the defects. They are detected by analyzing the frequency of supply current and judging whether secondary harmonics of the sinusoidal signal exists or not. Effectiveness of our way is con.rmed by some experiments.
Citation:
Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo, "Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test," ats, pp.406, 12th Asian Test Symposium (ATS'03), 2003
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