loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
12th Asian Test Symposium (ATS'03)
Minimizing Defective Part Level Using a Linear Programming-Based Optimal Test Selection Method
Xi?an, China
November 16-November 19
ISBN: 0-7695-1951-2
ASCII Text
x 
 
Yuxin Tian, Michael R. Grimaila, Weiping Shi, M. Ray Mercer, "Minimizing Defective Part Level Using a Linear Programming-Based Optimal Test Selection Method," Asian Test Symposium, pp. 354, 12th Asian Test Symposium (ATS'03), 2003.
 
 
BibTex
x
 
@article{ 10.1109/ATS.2003.1250836,
author = {Yuxin Tian and Michael R. Grimaila and Weiping Shi and M. Ray Mercer},
title = {Minimizing Defective Part Level Using a Linear Programming-Based Optimal Test Selection Method},
journal ={Asian Test Symposium},
volume = {0},
year = {2003},
issn = {1081-7735},
pages = {354},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2003.1250836},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - Minimizing Defective Part Level Using a Linear Programming-Based Optimal Test Selection Method
SN - 1081-7735
SP
EP
A1 - Yuxin Tian,
A1 - Michael R. Grimaila,
A1 - Weiping Shi,
A1 - M. Ray Mercer,
PY - 2003
KW - null
VL - 0
JA - Asian Test Symposium
ER -
 
Yuxin Tian, Texas A&M University
Michael R. Grimaila, Texas A&M University
Weiping Shi, Texas A&M University
M. Ray Mercer, Texas A&M University
Recent probabilistic test generation approaches have proven that detecting single stuck-at faults multiple times is effective at reducing the defective part level (DPL). Unfortunately, these test generation strategies increase the number of test patterns. In this paper, we present a novel linear programming-based method to accelerate the optimal selection of test sets to minimize the defective part level based upon the MPG-D model. Our experimental results show that the proposed method is on average 300 times faster than the existing test pattern selection method.
Citation:
Yuxin Tian, Michael R. Grimaila, Weiping Shi, M. Ray Mercer, "Minimizing Defective Part Level Using a Linear Programming-Based Optimal Test Selection Method," ats, pp.354, 12th Asian Test Symposium (ATS'03), 2003
Usage of this product signifies your acceptance of the Terms of Use.