12th Asian Test Symposium (ATS'03) On-Chip Short-Time Interval Measurement for High-Speed Signal Timing Characterization Xi?an, China November 16-November 19 ISBN: 0-7695-1951-2
We present in this paper an on-chip approach to obtain timing characterization for the ever faster high-speed communication systems. In the proposed short time interval measurement circuit, we use a time-to-digital converter, which consists of a charge pump, a comparator with hysteresis, a 6-bit digital counter, and a capacitor. During the measurement, we control a current source and a current sink to charge or discharge a common capacitor, and record the time length ratio of the charging and discharging process. Using this method, we can easily calculate most of the time-domain parameters. Because the measurement process is independent of the absolute value of the capacitor and current amplitude, this method minimizes the impact of the process variations.
Citation:
Tian Xia, Jien-Chung Lo, "On-Chip Short-Time Interval Measurement for High-Speed Signal Timing Characterization," ats, pp.326, 12th Asian Test Symposium (ATS'03), 2003 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||