Test Synthesis for Datapaths Using Datapath-Controller Functions

A
ATS
2003
12th Asian Test Symposium (ATS'03)
Abstract - Test Synthesis for Datapaths Using Datapath-Controller Functions

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12th Asian Test Symposium (ATS'03)

Xi?an, China

November 16-November 19

ISBN: 0-7695-1951-2

	ASCII Text	x
	Michiko Inoue, Kazuhiro Suzuki, Hiroyuki Okamoto, Hideo Fujiwara, "Test Synthesis for Datapaths Using Datapath-Controller Functions," Asian Test Symposium, pp. 294, 12th Asian Test Symposium (ATS'03), 2003.

	BibTex	x
	@article{ 10.1109/ATS.2003.1250826, author = {Michiko Inoue and Kazuhiro Suzuki and Hiroyuki Okamoto and Hideo Fujiwara}, title = {Test Synthesis for Datapaths Using Datapath-Controller Functions}, journal ={Asian Test Symposium}, volume = {0}, year = {2003}, issn = {1081-7735}, pages = {294}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2003.1250826}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Test Synthesis for Datapaths Using Datapath-Controller Functions SN - 1081-7735 SP EP A1 - Michiko Inoue, A1 - Kazuhiro Suzuki, A1 - Hiroyuki Okamoto, A1 - Hideo Fujiwara, PY - 2003 KW - design-for-testability KW - RTL circuit KW - at-speed testing KW - hierarchical test generation KW - non-scan design VL - 0 JA - Asian Test Symposium ER -

Michiko Inoue, Nara Institute of Science and Technology

Kazuhiro Suzuki, Nara Institute of Science and Technology

Hiroyuki Okamoto, Nara Institute of Science and Technology

Hideo Fujiwara, Nara Institute of Science and Technology

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2003.1250826

This paper proposes a test syntheses method for datapaths. The proposed method goes on design-for-testability while generating control sequences for justification and propagation at register-transfer level. Since the method fully utilizes functions of controllers as well as datapaths, it achieves small area overhead.

Index Terms:

design-for-testability, RTL circuit, at-speed testing, hierarchical test generation, non-scan design

Citation:

Michiko Inoue, Kazuhiro Suzuki, Hiroyuki Okamoto, Hideo Fujiwara, "Test Synthesis for Datapaths Using Datapath-Controller Functions," ats, pp.294, 12th Asian Test Symposium (ATS'03), 2003

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