Fault Diagnosis for Physical Defects of Unknown Behaviors

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12th Asian Test Symposium (ATS'03)

Xi?an, China

November 16-November 19

ISBN: 0-7695-1951-2

	ASCII Text	x
	Xiaoqing Wen, Hideo Tamamoto, Kewal K. Saluja, Kozo Kinoshita, "Fault Diagnosis for Physical Defects of Unknown Behaviors," Asian Test Symposium, pp. 236, 12th Asian Test Symposium (ATS'03), 2003.

	BibTex	x
	@article{ 10.1109/ATS.2003.1250816, author = {Xiaoqing Wen and Hideo Tamamoto and Kewal K. Saluja and Kozo Kinoshita}, title = {Fault Diagnosis for Physical Defects of Unknown Behaviors}, journal ={Asian Test Symposium}, volume = {0}, year = {2003}, issn = {1081-7735}, pages = {236}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.2003.1250816}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Fault Diagnosis for Physical Defects of Unknown Behaviors SN - 1081-7735 SP EP A1 - Xiaoqing Wen, A1 - Hideo Tamamoto, A1 - Kewal K. Saluja, A1 - Kozo Kinoshita, PY - 2003 KW - null VL - 0 JA - Asian Test Symposium ER -

Xiaoqing Wen, SynTest Technologies, Inc.

Hideo Tamamoto, Akita University

Kewal K. Saluja, University of Wisconsin-Madison

Kozo Kinoshita, Osaka Gakuin University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.2003.1250816

This paper proposes an X-fault model for fault diagnosis of physical defects with unknown behaviors by using X symbols. An efficient X-fault simulation method and an efficient X-fault diagnostic reasoning method are presented. Based on these, an X-fault diagnosis method is described to improve the failure analysis for a wide range of physical defects in complex IC circuits.

Citation:

Xiaoqing Wen, Hideo Tamamoto, Kewal K. Saluja, Kozo Kinoshita, "Fault Diagnosis for Physical Defects of Unknown Behaviors," ats, pp.236, 12th Asian Test Symposium (ATS'03), 2003

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